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IEEE Boston/Providence/New Hampshire Reliability Chapter
FREE In Person and Virtual Event
Measuring the Reliability of new technology is critical for any development team. Accelerated Life Testing (ALT) measures a new product’s life by testing at elevated stresses. It saves valuable time & resources; giving teams the right information rapidly. Join this webinar to get an overview of ALT and a few tips and tricks to ensure you avoid common pitfalls.
Measuring the Reliability of new technology is critical for any development team. Accelerated Life Testing (ALT) measures a new product’s life by testing at elevated stresses. It saves valuable time & resources; giving teams the right information rapidly. Join this webinar to get an overview of ALT and a few tips and tricks to ensure you avoid common pitfalls.
Agenda:
5:30 PM Pizza, salad, soft drinks, and Networking
6:00 PM Technical Presentation
6:45 PM Questions and Answers
7:00 PM Adjournment
Biography: Adam Bahret of Apex Ridge Reliability Consulting
Adam Bahret is the founder of Apex Ridge Consulting and a leading reliability expert who writes, speaks and coaches engineering teams on reliability as a competitive edge. His reliability strategy has delivered millions in savings for clients while mitigating risk and forming a foundation for reliability-fueled growth and brand dominance. His clients range across multiple industry segments, including medical devices, robotics, semiconductor, aerospace, consumer, and automotive.
Adam works with technical teams to improve the design while mentoring leadership teams in adopting the processes, language, and behaviors to build a reliability culture. He also introduces key reliability metrics such as “time-to-reliability” that guide organizational thinking and build a robust reliability culture that’s the hallmark of dominant top-performing technology companies.
Adam is the author of three books on reliability engineering: Devastate the Competition, How to Take Market Share Through Robust Design (2023), Reliability Culture, How Leaders Build Organizations that Create Reliable Products (Wiley 2021), and How Reliable is Your Product, 50 Ways to Improve Product Reliability (2nd Ed 2016). Adam has also released a series of small handbooks on specific reliability tools called “Adam’s The Perfect Reliability Tool” book series. “The Perfect HALT”, “The Perfect Accelerated Life Test”, “The Perfect Reliability Growth Test”, and “ The Perfect DFMEA.”
Adam has deep technical expertise and over 25 years of experience in product development and reliability engineering. He has an MS in Mechanical Engineering from Northeastern University, is an ASQ nationally certified reliability engineer, and an international speaker on technology, leadership, and product development. More information on Adam and Apex Ridge can be found at www.adambahret.com.
The meeting is open to all. You do not need to belong to the IEEE to attend this event; however, we welcome your consideration of IEEE membership as a career enhancing technical affiliation.
There is no cost to register or attend, but registration is required (so that we may purchase enough food!)
Registration: https://events.vtools.ieee.org/m/415811
IEEE Boston/Providence/New Hampshire Reliability Chapter
Please visit https://r1.ieee.org/boston-rl/
We will begin with a brief overview of radiation effects in electronics, and their effect on reliability. Then we will cover the history of the discovery and our growing awareness of them, with special attention paid to the place of the Harvard Cyclotron Laboratory (HCL)/Massachusetts General Hospital (MGH) Rad Test program in that history. We will then look at what factors made HCL so prominent in the early work of understanding these effects, and why the re-purposing of equipment built at HCL for the MGH program was particularly useful in electronics reliability testing. Finally, we will finish with a few words on the future of the MGH test program.
Agenda:
5:30 PM Pizza, salad, soda, and Networking
6:00 PM Technical Presentation
6:45 PM Questions and Answers
7:00 PM Adjournment
Ethan Cascio – Radiation Effects in Electronics: Brief Overview and History
Biography:
Ethan Cascio joined the staff of the Harvard Cyclotron Laboratory (HCL) in 1985 after receiving his BA in Physics from Reed college. Over the next 17 years at HCL he worked on both the joint project to develop proton therapy in collaboration with Massachusetts General Hospital (MGH) and the radiation effects testing program at HCL. He eventually became Operations Manager of the lab and primarily responsible for the radiation effects program. When Harvard closed HCL in 2002 following the transfer of the clinical treatment programs to the newly built Northeast Proton Therapy Center at MGH (later re-named the Burr Proton Therapy Center) he moved with the project over to MGH and became the Radiation Test Program Manager at the Burr center. At the Burr Center he established and continues to run the radiation test program, as well as provides clinical physics and engineering support for the proton therapy program. He is the author and co-author of numerous papers on the subjects of proton therapy, dosimetry, radiation effects in electronics and proton beamline design and instrumentation.
The meeting is open to all. You do not need to belong to the IEEE to attend this event; however, we welcome your consideration of IEEE membership as a career enhancing technical affiliation.
There is no cost to register or attend, but registration is required.
Registration will be open soon: https://events.vtools.ieee.org/m/420285